发明名称 IC TESTING DEVICE
摘要 <p>PURPOSE:To maintain the temperature of a semiconductor chip at a fixed value, and to inhibit the variation in the delay time of a circuit by using a gate array LSI of low power consumption type, provided with a dummy circuit, and by operating it at a frequency differentially varied to the operational frequency of a waveform generator as well as a strobe pulse generator. CONSTITUTION:A dummy circuit 9 is provided in a semiconductor chip of an LSI, the main circuit of which is formed out of a waveform generator 3, a strobe generator 7 and a logic comparator 8. A signal PCLK, the frequency of which is differentially varied to the frequency of a timing signal DB given to the maim circuit, is given to the circuit 9. When the signal DB is changed from a frequency f1 to f2 (f1<f2), the frequency of the signal PCLK is differentially changed from f2 to f1. In this way, the power consumption of the main circuit as well as of the dummy circuit 9 is maintained at a fixed level on the whole regardless of the variation in frequency, and the variation in the delay time of the waveform generator 3 as well as of the generator 7 following the temperature increase of the semiconductor chip is thus prevented.</p>
申请公布号 JPH04279874(A) 申请公布日期 1992.10.05
申请号 JP19910043793 申请日期 1991.03.08
申请人 ADVANTEST CORP 发明人 YAMAZAKI MASAHARU
分类号 G01R31/28;G01R31/3183;G01R31/319;G06F1/04 主分类号 G01R31/28
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