发明名称 BIAS CIRCUIT FOR DURABLE MEMORY ARRAY
摘要 <p>PURPOSE: To provide a bias circuit for reading any selected cell inside a semiconductor memory cell array. CONSTITUTION: A semiconductor memory cell 10 is connected to a drain column line 19, source column line 17 and word line 15. The bias circuit is provided with a common node N, a resistor means T12 connected between this node N and the source and drain column lines 17 and 19, a drain selecting means T15 for transmitting a 1st bias voltage to the selected drain column line during a read cycle, a source selecting means T14 for transmitting a 2nd bias voltage to the source column line, and a reference selecting means T13 for connecting the source column line to a reference potential Vss. A sense amplifier and a driver circuit are respectively provided with three transistors T1-T11 at least and have outputs connected to the drain column line and source column line of a memory array.</p>
申请公布号 JPH04274093(A) 申请公布日期 1992.09.30
申请号 JP19910338884 申请日期 1991.12.20
申请人 TEXAS INSTR INC <TI> 发明人 JIYON EFU SUKURETSUKU;SHIEIRETSUSHIYU AARU KADAKIA;FUATSUTO SHII TORUONGU
分类号 G11C17/00;G11C7/12;G11C16/04;G11C16/06;G11C16/26 主分类号 G11C17/00
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