发明名称 Surface potential measuring system
摘要 In a system for measuring a surface potential of a sample, a probe is located above. A surface of the sample with a small gap and is vibrated by a piezoelectronic element which is energized by a oscillator. A potential of the distal end of the probe is changed and is converted into an electrical signal. The surface potential is obtained from the electrical signal.
申请公布号 US5151659(A) 申请公布日期 1992.09.29
申请号 US19900515419 申请日期 1990.04.27
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 TANAKA, KUNIYOSHI;SHIROUZU, SHUNJI;OHTA, MINORU;MIYAGAWA, HIDEO
分类号 G01N27/00;G01N27/60 主分类号 G01N27/00
代理机构 代理人
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