| 摘要 |
PURPOSE: To enable a complex circuit test of a complex combination by a method wherein a serial test card system is connected to a test specimen device, and various signals between the test specimen devices are controlled by a personality module. CONSTITUTION: A substrate tester 100 is used for testing a circuit of a test specimen device 102. A pattern storing sequencer module 104 provides a test function in a circuit required for a test of the device 102 via buses 110, 112. Further, four personality modules are included in a serial test card 106, an input signal is sent to the device 102 via the bus 112, while a response signal from the device 102 is received via the bus 110. Further, the card 106 communicates with a controller 108 via a bus 116. Further, in a device 100, the card 106 communicates mutually with the sequencer 104 via a bus 118. A test by the card 106 is complemented by the sequencer 104 and controller 108. |
