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发明名称
IC TESTING DEVICE
摘要
申请公布号
JPH04270975(A)
申请公布日期
1992.09.28
申请号
JP19910033160
申请日期
1991.02.27
申请人
ADVANTEST CORP
发明人
KOBAYASHI MINORU;TSUKAHARA HIROSHI
分类号
G01R31/28;G01R29/02;G01R31/3183
主分类号
G01R31/28
代理机构
代理人
主权项
地址
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