发明名称 GALLIUM ARSENIDE CRYSTAL OF LOW DEFECT DENSITY AND SEMIIINSULATION
摘要 PURPOSE:To obtain the large-sized crystal of which the defect such as dislocation is reduced and which has an improved quality by a method wherein the gallium arsenide crystal containing deep acceptor impurity excessively as compared with shallow donor impurity is made to contain specific boron of which the density of oxygen is less than a specified value. CONSTITUTION:The gallium arsenide crystal of semi-insulation containing the deep acceptor impurity such as chromium and vanadium excessively in density compared with the shallow donor impurity such as silicon and having specific electric resistance of 10<6>OMEGAcm or more in 300 deg.K is made to contain the boron of 1.2X10<17>- 1.2X10<18>cm<-3> and, in addition, the density of oxygen thereof is set at 2X10<18>cm<-3> or less. By this method, the large-sized gallium arsenide crystal having the diameter of 50mm. or more and little crystal defect such as dislocation and deposits can be obtained.
申请公布号 JPS56100410(A) 申请公布日期 1981.08.12
申请号 JP19800002930 申请日期 1980.01.14
申请人 SUMITOMO ELECTRIC INDUSTRIES 发明人 AKAI SHINICHI
分类号 C30B15/04;C30B29/42;H01L21/02;H01L21/208 主分类号 C30B15/04
代理机构 代理人
主权项
地址