| 摘要 |
The subject of the present invention is a method for optical measurement of a thickness of coating (2) deposited on a metal substrate (1), and having absorption properties in one range of wavelengths and transparency properties in a second range of wavelengths. The method consists in focusing a first beam (4), the wavelength of which belongs to the first range, at a first point P on the substrate (1)/coating (2) interface (3), in focusing a second beam (5), the wavelength of which belongs to the second range, at a point Q on the substrate (1)/coating (2) interface (3), in measuring the reflectances of the two reflected beams (6, 7) and in calculating the thickness of the coating (2) from the measurement of the reflectances of the two reflected beams (6, 7). <IMAGE>
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