发明名称 A semiconductor memory device.
摘要 <p>A readout column gate (23) comprises two [2] nMOS transistors (24,25). These nMOS transistors (24,25) connect with corresponding bit lines (BL,BLX) at their respective gates, with corresponding data buses (DB,DBX) at their respective drains, and with common readout column selection line (CLR) at their respective sources. The column driver sets the voltage of the readout column selection line (CLR) to a voltage different than the voltage precharged to the bit lines (BL,BLX) when a column is selected. The improved readout column gate (23) expedites a DRAM access without incurring an increase in the size of a chip area. &lt;IMAGE&gt;</p>
申请公布号 EP0505091(A1) 申请公布日期 1992.09.23
申请号 EP19920302135 申请日期 1992.03.12
申请人 FUJITSU LIMITED 发明人 TAGUCHI, MASAO
分类号 G11C11/41;G11C7/10;G11C11/401;G11C11/409;G11C11/4096;G11C11/417;H01L21/8242;H01L27/108 主分类号 G11C11/41
代理机构 代理人
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