首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
METHOD FOR ELECTRON CHARGE MEASURING
摘要
申请公布号
SU1764075(A1)
申请公布日期
1992.09.23
申请号
SU19864084801
申请日期
1986.07.09
申请人
MO FIZIKO-TEKHNICHESKIJ INSTITUT
发明人
FREJBERG GENNADIJ N,SU;OVCHINNIKOV ALEKSEJ P,SU;TEVRYUKOV ALEKSEJ A,SU;MUSHENKOVA SVETLANA B,SU;MAKALSKIJ STANISLAV A,SU
分类号
G09B23/18
主分类号
G09B23/18
代理机构
代理人
主权项
地址
您可能感兴趣的专利
Low power A/D converter
Apparatus and method for the automated marking of defects on webs of material
SRAM with switchable power supply sets of voltages
Zoom lens and imaging apparatus incorporating the same
Natural pan tilt zoom camera motion to preset camera positions
GPIO mux/dynamic port configuration
Methods and apparatus for inspecting materials
Semiconductor device
Seed-preferred regulatory elements
Lubricant composition and triazine-ring-containing compound
Optical glass, precision press-molding preform, process for production thereof, optical element and process for the production thereof
Apparatus and method for estimating interference and noise in a communication system
Radio base station and frame configuration method using TDMA scheme and SDMA scheme
Method for providing user interface using received terrestrial digital broadcasting data in a mobile communication terminal
Accessing semiconductor memory device according to an address and additional access information
Image processing apparatus, image forming apparatus, and image processing method
Metastability error reduction in signal converter systems
Data holding circuit and signal processing circuit
Semiconductor device having contact failure detector
Contact device for touch contacting an electrical test specimen, and corresponding method
