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发明名称
SOLDER HEAT TEST METHOD FOR PLASTIC SEALED SEMICONDUCTOR DEVICE
摘要
申请公布号
JPH04266045(A)
申请公布日期
1992.09.22
申请号
JP19910027309
申请日期
1991.02.21
申请人
MATSUSHITA ELECTRON CORP
发明人
SUGAWA MANABU
分类号
G01R31/00;G01R31/26;H01L21/66
主分类号
G01R31/00
代理机构
代理人
主权项
地址
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