SEMICONDUCTOR INTEGRATED CIRCUIT TESTING DEVICE,申请号JP19910025822-传众专利搜索

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发明名称	SEMICONDUCTOR INTEGRATED CIRCUIT TESTING DEVICE
摘要
申请公布号	JPH04264747(A)	申请公布日期	1992.09.21
申请号	JP19910025822	申请日期	1991.02.20
申请人	NEC CORP	发明人	MAEDA TETSUNORI
分类号	G01R31/26;G01R31/28;G01R31/317;H01L21/66;H01L21/82;H01L23/34	主分类号	G01R31/26
代理机构		代理人
主权项
地址

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