发明名称 FORMATION OF FINE PATTERN
摘要 PURPOSE:To enable silylation to be conducted at room temp. and to form good fine patterns by silylating a resist by using a silylating agent contg. imidazole to be a catalyst for silylation or its deriv. CONSTITUTION:The polyimide resist 2 to form a lower layer resist is applied on a semiconductor substrate 1 and thereafter, a novolak resist 3 to form an upper layer resist is applied thereon. The upper layer resist 3 is then subjected to exposing and developing to form patterns and thereafter, the silylating agent 7 prepd. by incorporating the imidazole into, for example, chlorotrimethyl silane is sprayed at room temp. to form a silylated layer 9 on the surface of the upper layer resist 3. The fine patterns 10 are then formed by RIE etching using gaseous O2 plasma with the silylating layer 9 as a mask.
申请公布号 JPH04264557(A) 申请公布日期 1992.09.21
申请号 JP19910025914 申请日期 1991.02.20
申请人 NEC CORP 发明人 SOENOSAWA MASANORI
分类号 G03F7/38;H01L21/027 主分类号 G03F7/38
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