| 摘要 |
PURPOSE: To efficiently transfer data by taxing a register in a device being in the middle of test, which is connected in series to another device in a scan chain, as the transfer destination or the transfer source. CONSTITUTION: (n) pieces of effective L-bit segments are connected before L1 filling bits whose number corresponds to the accumulated number in a register cell of a device 10' above an L-bit register 14 in a device 10 in the middle of test. First L1 bits of an nL-bit block in an (L1+nL)-bit stream are shifted to the chain to drive out data stored in registers above the L-bit register in the device 10. Remaining bits in the (L1+nL)-bit stream are shifted to the chain or devices no and 10', and L1 filling bits are shifted to registers or the device 10' above the device 10 being in the middle of test. |
