MANAGING SYSTEM OF PROGRAM OF IC TESTER,申请号JP19910042924-传众专利搜索

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发明名称	MANAGING SYSTEM OF PROGRAM OF IC TESTER
摘要
申请公布号	JPH04259867(A)	申请公布日期	1992.09.16
申请号	JP19910042924	申请日期	1991.02.15
申请人	HITACHI ELECTRON ENG CO LTD	发明人	SASAGAWA KIYOSHI
分类号	G01R31/28	主分类号	G01R31/28
代理机构		代理人
主权项
地址

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