发明名称 ELECTRON BEAM EQUIPMENT
摘要 PURPOSE:To increase secondary electron detection efficiency and measure specimen voltage with high precision. CONSTITUTION:An air gap part 29 which penetrates the part between a coil winding part 27 and the vicinity of the outlet of an energy analyzer 9 and has rotation symmetry having an optical axis 3 as the center is installed in magnetic substance 19 of an objective 7, and a magnetic lens 24 is formed in the vicinity of the outlet of the energy analyzer 9 by using leakage magnetic field 30 generated between a magnetic substance optical axis side part 19A in the upper part of the air gap part 29 and a magnetic substance optical axis side part 19B in the lower part.
申请公布号 JPH04260345(A) 申请公布日期 1992.09.16
申请号 JP19910021781 申请日期 1991.02.15
申请人 FUJITSU LTD 发明人 NAKAZAWA KAZUHIRO;ITO AKIO
分类号 G01N23/225;G01R31/302;H01J37/05;H01J37/244;H01J37/28;H01L21/66 主分类号 G01N23/225
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