| 摘要 |
<p>The invention relates to tests for checking the integrity of circuits (16) employed in bidirectional serial transmissions. In order to be able to test transceivers (12) operating at very high frequency without adding any disturbance, the test consists either in leaving the serial output of the transceiver (12) disconnected from the line (L), or in disconnecting (INF) its matching impedance, in operating the transmission of signals and in comparing the transmitted signals with the reception signals detected by the same transceiver. As a variant, the matching impedance of the transceiver can be disconnected from the distant station. Application in particular to parallel/serial interface integrated circuits. <IMAGE></p> |
