发明名称 EVALUATION TEST EQUIPMENT FOR AUTOMATIC PRESET FUNCTION
摘要 PURPOSE:To offer the evaluation test equipment able to evaluate an automatic preset function by employing two sets of signal oscillators. CONSTITUTION:The above equipment is provided with a 1st signal oscillator 101 oscillating a signal of a 1st frequency, a 2nd signal oscillator 102 oscillating a signal of the 2nd frequency different from the frequency of the signal oscillated from the 1st signal oscillator 101, a high frequency amplifier 103 inputting the output of the 1st signal oscillator 101 and the output of a 2nd signal oscillator 102 and having a nonlinear amplifier characteristic, a signal attenuator 104 attenuating the output of the high frequency amplifier 103 to a prescribed level.
申请公布号 JPH04253497(A) 申请公布日期 1992.09.09
申请号 JP19910009570 申请日期 1991.01.30
申请人 FUJITSU TEN LTD 发明人 KANEZAKI SADAJI;MURAOKA TATSUO
分类号 H04B17/00;H04N5/44;H04N5/46;H04N17/04 主分类号 H04B17/00
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