发明名称 |
ATOMIC FORCE MICROSCOPY |
摘要 |
An atomic force microscope includes a tip (12) mounted on a micromachined cantilever (10). As the tip scans a surface (24) to be investigated, interatomic forces between the tip and the surface induce displacement of the tip. A laser beam is transmitted to and reflected from the cantilever for measuring the cantilever orientation. In a preferred embodiment the laser beam has an elliptical shape. The reflected laser beam is detected with a position-sensitive detector (22), preferably a bicell. The output of the bicell is provided to a computer for processing of the data for providing a topographical image of the surface with atomic resolution. <IMAGE>
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申请公布号 |
US5144833(A) |
申请公布日期 |
1992.09.08 |
申请号 |
US19900588795 |
申请日期 |
1990.09.27 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
AMER, NABIL M.;MEYER, GERHARD |
分类号 |
G01B11/30;G01B7/34;G01B21/30;G01N37/00;G01Q20/02;G01Q20/04;G01Q60/24 |
主分类号 |
G01B11/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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