发明名称 INSPECTING DEVICE FOR MULTILAYER STATE
摘要 PURPOSE:To correctly inspect the multilayer state of the surface of a subject for inspection in order to determine whether the state is good or bad using a multilayer-state inspecting device. CONSTITUTION:An image of the boundary portion between print layers located on both of the upper and lower surfaces of a two-color printed matter is taken by a television camera 20. Normal images of each print layer are stored as first and second reference images on a memory 40. Position measuring circuits 60, 70 measure the shift of the boundary portion between the first reference image and a taken image from the corresponding portion of the taken image and the shift of the boundary portion between the second reference image and the first reference image from the corresponding portion of the taken image, respectively. In order to remove the shift of each measured position, the first and second reference images have their positions corrected to respective corrected images by respective correcting circuits 80, 90. The logical addition of each corrected image is obtained by a registration circuit 100 and the final corrected image is obtained. The printed state of the two-color printed matter is checked by the matching process of the final corrected image and the taken image, which is performed by a pattern matching circuit 110.
申请公布号 JPH04250348(A) 申请公布日期 1992.09.07
申请号 JP19910012870 申请日期 1991.01.08
申请人 NIPPONDENSO CO LTD 发明人 HIEDA TAKU;YOKOYAMA YOSHIO
分类号 B41F33/14;G01J1/42;G01N21/84;G01N21/88;G01N21/93;G01N21/956;G06T1/00;G06T7/00;H01L21/66 主分类号 B41F33/14
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