发明名称 |
POLYSILICON THIN FILM SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE:To provide a polysilicon thin film semiconductor device improved characteristics by reducing crystal grain boundaries by increasing the grain size of silicon crystalline grains and reducing the density of number of silicon dangling bonds in the boundaries. CONSTITUTION:A polysilicon thin film semiconductor device contains nitrogen in a channel layer in a semiconductor device using a polysilicon thin film as the channel layer, and has a maximum value in a depth direction distribution of its content at a boundary side of the layer and a substrate. |
申请公布号 |
JPH04250669(A) |
申请公布日期 |
1992.09.07 |
申请号 |
JP19910025472 |
申请日期 |
1991.01.25 |
申请人 |
TOSHIBA CORP |
发明人 |
SETO TOSHISUKE;NOZAKI HIDETOSHI;MORI KAZUNARI |
分类号 |
H01L29/78;H01L21/205;H01L21/336;H01L29/786 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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