发明名称 OVERLAP AMOUNT MEASUREMENT DEVICE OF PRINTED MATTER
摘要 PURPOSE:To provide an automatic measurement device for measuring the overlap amount of halftone and its overlap direction of printed matter without individual variation such as in the visual measurement by an inspector. CONSTITUTION:This printed matter overlap amount measurement device consists of a microscope 3 for observing printed matter 1 and a half-tone image, TV camera 4, a device 6 to make an image signal from the TV camera 4 binary, a device 7 to connect binary data, a device 8 to measure the halftone center based on the connected process data and a device 9 to calculate an overlap amount from the halftone center, as constituent components of an image processing device 5.
申请公布号 JPH04250042(A) 申请公布日期 1992.09.04
申请号 JP19910004509 申请日期 1991.01.18
申请人 MITSUBISHI HEAVY IND LTD 发明人 WATANABE SHIGEYUKI;OKIMOTO TETSUO
分类号 B41C1/00;B41F33/14;G01N21/84;G01N21/88;G03F3/10;G03F5/00;H04N1/411 主分类号 B41C1/00
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