发明名称 Device for simultaneously measuring particle or quantum beams from many samples at once
摘要 A device for simultaneously measuring the level of particle and quantum radiation of a plurality of samples which includes a microplate having a plurality of wells for accommodating the plurality of samples. A plurality of light conductors, at least one for each well, is positioned to receive light from each well and forward it to a photodetector. When luminescence is determined, each well has only one conductor associated therewith and when liquid scintillation is determined, each well has two light conductors associated therewith.
申请公布号 US5144136(A) 申请公布日期 1992.09.01
申请号 US19900578627 申请日期 1990.09.06
申请人 RSM ANALYTISCHE INSTRUMENTE GMBH 发明人 KUBISIAK, HELMUT
分类号 G01T1/00;G01T1/204;G01T7/00;G01T7/02 主分类号 G01T1/00
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