发明名称 |
ELECTRON BEAM TESTING OF ELECTRONIC COMPONENTS |
摘要 |
ELECTRON BEAM TESTING OF ELECTRONIC COMPONENTS An electron beam testing apparatus for applying an electron beam to parts of an electronic component and measuring the secondary electrons released from the part including a secondary electron collector having a plurality of vertically extending screens with a detector positioned adjacent one of the screens. A different voltage is applied to each of the screens of the collector for collecting the secondary electrons over a large area. The apparatus may include a combination blanking and Faraday cup for metering the electron beam current when it is blanked. The apparatus may also be used to measure net work capacitance by measuring the time required to charge a network to a predetermined voltage. |
申请公布号 |
CA1307057(C) |
申请公布日期 |
1992.09.01 |
申请号 |
CA19890590121 |
申请日期 |
1989.02.03 |
申请人 |
MICROELECTRONICS AND COMPUTER TECHNOLOGY CORPORATION |
发明人 |
WOODARD, OLLIE C., SR.;ROSS, ANDREW W. |
分类号 |
G01R31/305;H01J37/04;H01J37/244 |
主分类号 |
G01R31/305 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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