发明名称 APPARATUS FOR INSPECTING SURFACE FLAW
摘要 PURPOSE:To detect a small flaw even in the case of a painted surface having large undulation. CONSTITUTION:The roughness of a surface to be inspected is detected by a surface roughness meter 13 and removed from the video signal of the surface to be inspected detected by a unidimensional sensor 11 in a filter processing part 22 and the part of a flaw F is removed to smooth the video signal. By this method, a threshold level for binarization can be set high in a flaw detection part 23 regardless of the magnitude of the roughness of the surface to be inspected. By this constitution, the inspection accuracy of a surface flaw is enhanced.
申请公布号 JPH04244949(A) 申请公布日期 1992.09.01
申请号 JP19910010542 申请日期 1991.01.31
申请人 NISSAN MOTOR CO LTD 发明人 ENDO MOTONORI
分类号 G01B11/30;G01N21/88;G06T1/00;G06T7/00 主分类号 G01B11/30
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