发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 The method for integrating a high voltage transistor and a general transistor in one chip comprises the steps of forming an N+ buried layer (3) into a Si substrate (1) to grow an epitaxial layer (4) over the whole substrate (1), ion-implanting and diffusing an N impurities to form N+ buried layers (51',52'), forming a P+ buried layer (6) for isolating between the devices by ion-implanting and diffusing P impurities, forming a second epitaxial layer (7) on the whole substrate, ion-implanting and diffusing N impurities to form N+ collector regions (81',82'), forming a P+ buried layer (9) as a second isolation area by ion-implanting and diffusing P impurities and forming base and emitter regions into the epitaxial layer (7).
申请公布号 KR920007365(B1) 申请公布日期 1992.08.31
申请号 KR19900000627 申请日期 1990.01.19
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KANG, HYON - SUN
分类号 H01L27/08;(IPC1-7):H01L27/08 主分类号 H01L27/08
代理机构 代理人
主权项
地址
您可能感兴趣的专利