| 摘要 |
PURPOSE:To realize test operation equal to a dynamic burn-in device by only supplying power supply and a clock to a microcomputer to be tested. CONSTITUTION:A micro-instruction is stored in a micro-memory device 11, and the address of this micro-memory device 11 is generated by an address generation circuit 16, and the above-mentioned micro-instruction is read out and controlled in conformity to this address. The prescribed clock is counted by a counter 14, and a switching circuit 13 switches selectively the output of the address generation circuit 16 or the count value of the above-mentioned counter 14 according to a value impressed to the setting terminal 19 of the mode of the test operation, and makes one of them the address of the above- mentioned micro-memory device 11. |
