| 摘要 |
PURPOSE:To provide dynamic BT of a LSI using micro program control method. CONSTITUTION:In a data processing unit 1125, micro address is incremented in order at a test mode, and the data is processed inside of a LSI in response to a micro code, which is fetched from a control memory 122 in response to the micro address. In a command decoder 116 and an address generating unit 119, the external data is clamped to a power source or the ground to make a LSI to be tested fetch a specified command code. Gate of the inside of the LSI to be tested is thereby activated at the time of acceleration test. |
