发明名称 |
SEMICONDUCTOR STRUCTURE WITH POLYSILICON-LAND AND FORMING METHOD THEREOF |
摘要 |
PURPOSE: To obtain a method for forming a conductive/resistive lamination polysilicon land by a semiconductor structure and a structure formed by the method. CONSTITUTION: A semiconductor structure is formed on a semiconductor substrate, has a set of first metal contact studs such as 30-1 in contact with at least one of active region 21/polysilicon lines such as 23-1, and contains first passivation thick films 26/27 whose surfaces are coplanar to those of the studs and a plurality of polysilicon lands such as 31-l that are formed on a planar structure and have a high resistance or a high conductivity or both properties bring in contact with the first contact studs. |
申请公布号 |
JPH04237132(A) |
申请公布日期 |
1992.08.25 |
申请号 |
JP19910138638 |
申请日期 |
1991.05.15 |
申请人 |
INTERNATL BUSINESS MACH CORP <IBM> |
发明人 |
KAARU SEDERUBOOMU;ROORAN SHIYANKURU;MIRIAMU KOONBU;PATORITSUKU MONE |
分类号 |
H01L23/52;H01L21/3205;H01L21/60;H01L21/768;H01L23/522;H01L23/532;H01L27/10 |
主分类号 |
H01L23/52 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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