发明名称 |
AUTOMATIC VISUAL INSPECTION APPARATUS FOR ELECTRONIC ELEMENT |
摘要 |
PURPOSE:To provide an automatic visual inspection apparatus for electronic elements which can automate the removal of defective products and can prevent the outflow of the defective products. CONSTITUTION:A lead frame 5 before the separation of an electronic element is moved with a moving device 1. The appearance of the electronic element during the movement is picked up with a camera 2. The information of the camera 2 is compared with the reference information of the electronic element without the defect in the appearance. Thus the quality is judged with a quality judging part 3. The electronic element which is determined as defective is removed with a removing means 4. |
申请公布号 |
JPH04235305(A) |
申请公布日期 |
1992.08.24 |
申请号 |
JP19910002171 |
申请日期 |
1991.01.11 |
申请人 |
KANEBOU DENSHI KK |
发明人 |
IKUTA SUSUMU;KASHIMOTO YOSHITATSU;SUZAKI MITSUAKI |
分类号 |
G01B11/24;G01B11/245;G06T1/00;H05K13/08 |
主分类号 |
G01B11/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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