发明名称 AUTOMATIC VISUAL INSPECTION APPARATUS FOR ELECTRONIC ELEMENT
摘要 PURPOSE:To provide an automatic visual inspection apparatus for electronic elements which can automate the removal of defective products and can prevent the outflow of the defective products. CONSTITUTION:A lead frame 5 before the separation of an electronic element is moved with a moving device 1. The appearance of the electronic element during the movement is picked up with a camera 2. The information of the camera 2 is compared with the reference information of the electronic element without the defect in the appearance. Thus the quality is judged with a quality judging part 3. The electronic element which is determined as defective is removed with a removing means 4.
申请公布号 JPH04235305(A) 申请公布日期 1992.08.24
申请号 JP19910002171 申请日期 1991.01.11
申请人 KANEBOU DENSHI KK 发明人 IKUTA SUSUMU;KASHIMOTO YOSHITATSU;SUZAKI MITSUAKI
分类号 G01B11/24;G01B11/245;G06T1/00;H05K13/08 主分类号 G01B11/24
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