TEST METHODS AND CIRCUIT OF SEMICONDUCTOR CELL

摘要

In direct current (DC) test method of semiconductor device, the over a constant voltage is biased at input pad. The test enable signal is made by regulating the voltage dropped to the CMOS level. The three mode signal having different stat each other is selected during the operate of the test enable signal. The signal of positive or negative logic which provides the input/output characteristics of semiconductor device is displayed at output pad according to the logical combination state of the three mode selection signal.