METHOD FOR FORMING TIMING TEST PROGRAM

摘要

PURPOSE: To conduct such regulation of timing of a test pattern as to depend on an internal state of a device, on the basis of an information output from a simulator not including the information regarding the timing and the internal state of the device, in a method of executing an IC device test related with a timing operation. CONSTITUTION: A test machine description regarding a state of timing of a device is led out from a device timing diagram and each test pattern is analyzed in correlation with the test machine description. Time set labels are attached to some combinations of pins and a waveform to be impressed in a test is determined.