| 摘要 |
In this invention, a distributed constant line on a microwave IC is formed of a Schottky metal, and a semiconductor conductive layer contacting the distributed constant line at least at one position and an ohmic contact electrode contacting the semiconductor conductive layer are arranged. According to this invention, characteristics of ICs can be optimized against a variation in elements combined with a circuit comprising the distributed constant line after the manufacture of ICs.
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