| 摘要 |
<p>PURPOSE:To check simply the quality of an LSI by comparing resultant data of the test in which a test pattern is carried out, with the pattern data previously set. CONSTITUTION:A test pattern preparing element 6 prepares a test pattern, when a test signal (logic 1) is input to an input pin 2 for test and test pattern data are input to data input pins 4. A test circuit 7 carries out this test pattern and outputs test results. A multiple-input LFSR8 receives the results, and data stored in the LFSR8 is compared (9) with the pattern data previously set. A comparison element 9 outputs a high level (logic 1) when these compared results agrees, a light emitting diode (LED) is lighted and a tested LSI is judged an article of good quality. In the time of disagreement, the element 9 outputs a low level (logic 0), the LED remains as it was not lighted and the LSI is judged an article of bad quality.</p> |
