Real=time bit error rate detector for A=D converter - has test wave generator coupled to A=D converter, sampling test waveform for comparison with theoretical data

摘要

An A/D converter (1) is coupled to a test wave generator (2) for the converter supply and sample data transmission. To the converter is coupled a digital data valve comparator (4), supplying theoretical data based on the test waveform at the time of t is sampling, and comparing sampled with theoretical data. The comparison provides a difference between the two types of data. The digital data value comparator generates a bit error signal, when the comparison exceeds a preset value. An error counter (91, 92) is coupled to the A/D converter for receiving and counting the bit error signals. USE/ADVANTAGE - For A/D converter testing, with high speed and precision bit error rate measuring.