发明名称 SEMICONDUCTOR RADIANT RAYS MEASURING EQUIPMENT
摘要 PURPOSE:To enable soundness of a function for measuring a dose to be checked by allowing an output voltage to be changed to an inverse bias voltage and a zero voltage at a specified cycle by adding a check mode command to an inverse-bias application means between both electrodes of a semiconductor detector. CONSTITUTION:A constant control signal 21a is turned and a control signal 21b is turned off on while a switch 12 is off, thus enabling an inverse-bias voltage Vb to be applied to a detector 2 continuously by a voltage switching part 24. A dose for radiant rays 4 is measured by a counter signal 11a. Also, while the switch 12 is turned on, a voltage pulse train consisting of a pulse 8a4 appears intermittently at an output of a preamplifier 6 as a pulse train signal 8a, thus enabling check for soundness of a function for measuring the dose in a measuring equipment 26 as well as that for an inverse-bias voltage application means 25 to be performed with the counter signal 11a.
申请公布号 JPH04220590(A) 申请公布日期 1992.08.11
申请号 JP19900403963 申请日期 1990.12.20
申请人 FUJI ELECTRIC CO LTD 发明人 NAGASE YOSHIYUKI
分类号 G01T1/24 主分类号 G01T1/24
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