发明名称 FUNCTION TESTING METHOD OF CACHE TAG RAM IN LIMITED ACCESS PROCESSOR SYSTEM
摘要 PURPOSE: To functionally conduct a test on cache tag RAM in a processor system where the access of a kernel is impossible. CONSTITUTION: An error is judged to exist or not in cache tag RAM 22. When on error exists, the patterns of '1' and '0' are sequentially supplied until a bit pattern which actually exists in an erroneous tag RAM location is obtained, and the erroneous RAM location is tested. The obtained bit pattern is compared with an expected bit pattern. Thus, information on the precise location of the error is obtained so that a defective chip can be exchanged.
申请公布号 JPH04220744(A) 申请公布日期 1992.08.11
申请号 JP19910047264 申请日期 1991.01.28
申请人 JOHN FLUKE MFG CO INC 发明人 MASHIYUU PII MUUA
分类号 G06F11/22;G06F12/00;G06F12/08;G06F12/16;G11C29/10;G11C29/44 主分类号 G06F11/22
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