发明名称 MEASURING DEVICE FOR PART POSITION OR THE LIKE
摘要 PURPOSE:To rapidly measure a position and posture of an IC having a plurality of pins with simple circuitry and also highly precisely measure the position and posture of a part without being influenced by the accuracy of an outer size of a package. CONSTITUTION:An image obtained by picking up an image of an IC is binary coded in an image input unit 11, and the binary image is stored in an image memory 12. A CPU 18 scans the binary image to detect a black pixel at the tip of an optional pin and then sets a window passing through the tip position to measure a position of gravity of the image of the tip of the pin contained in the window. Then with the position of gravity as reference, a pitch of the pin is moved to measure the position of gravity of a next pin sequentially.
申请公布号 JPH04220507(A) 申请公布日期 1992.08.11
申请号 JP19900413487 申请日期 1990.12.20
申请人 OMRON CORP 发明人 FUJIEDA SHIRO
分类号 G01B11/00;G06T1/00;G06T7/00;H05K13/04 主分类号 G01B11/00
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