| 摘要 |
<p>The invention relates to a method and a device for testing the surface quality of a transmitting optical element, in particular a window of optronic visible and/or infrared observation equipment. The method consists in transmitting into the optical element a light flux which is labelled and confined inside this element, and in measuring the labelled light flux emerging from the element to be tested in the presence of surface defects. The implementing device comprises a modulation signal generator (1), a light source (2) which injects a modulated flux into the optical element to be tested (3), a light detector (16), and a synchronous detector (7) for extracting and measuring the modulated signal. Application to testing the quality of transmission and to locating a defective optical element in a complex optical system. <IMAGE></p> |
