发明名称 CONTROL APPARATUS FOR ADHESIVE FORCE OF ADHESIVE AGENT ADHERING BETWEEN SEMICONDUCTOR WAFER AND SUBSTRATE
摘要 <p>In a control apparatus for controlling or changing an adhesive force of an adhesive agent (25) decreasingly a workpiece (17) comprising a semiconductor wafer (27) adhered through an adhesive agent (25) to a substrate (26) is charged into a container (6) having a light transmission window (33) and a closure member (32) and the air in the closed chamber thus formed is removed by a deoxygenating means (35) and under this oxygen free condition the photo-setting adhesive agent (25) is irradiated in the closed container (6) by a light, so that the adhesive force of the adhesive agent (25) is weakened in a moment or a very short time, and the time for manufacturing a semiconductor can be shortened and the productivity thereof can be improved. It is of further advantage that a cassette casing (18) containing plural workpieces (17), a charging conveyor (13) and a charging arm (21) are provided on one side of the container (6), and a discharging arm (22) for taking out the workpiece (17) from the container (6), a discharging conveyor (14) and an empty cassette casing (18) are provided on the other side thereof, so that the treatment for weakening the adhesive force of the adhesive agent (25) of the workpiece (17) can be carried out automatically at a high efficiency.</p>
申请公布号 EP0226949(B1) 申请公布日期 1992.08.05
申请号 EP19860117185 申请日期 1986.12.10
申请人 LINTEC KABUSHIKI KAISHA 发明人 IRIE, EIICHI
分类号 B29C65/00;G01N19/04;H01L21/00;H01L21/683 主分类号 B29C65/00
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