发明名称 Process for producing a stacked capacitor of a dram cell
摘要 A stacked capacitor of the fin-like structure is provided wherein the plurality of polysilicon layers constituting the storage electrode are connected with each other in the sawtooth-like manner to overcome the structural instability of the fin-like structure. The polysilicon layers constituting the storage electrode are extended overlaying each other, so that the capacity of the capacitor in a highly integrated DRAM may be increased without increasing the area occupied by the capacitor.
申请公布号 US5135883(A) 申请公布日期 1992.08.04
申请号 US19900582380 申请日期 1990.09.14
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 BAE, DONG-JOO;CHIO, KYU-HYUN;BAEK, WON-SHIK
分类号 H01L27/04;H01L21/02;H01L21/822;H01L21/8242;H01L27/10;H01L27/108 主分类号 H01L27/04
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