TIME DIVISION INTERFACE CIRCUIT AND ELECTRONIC PARTS TESTING SYSTEM,申请号JP19900401160-传众专利搜索

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发明名称	TIME DIVISION INTERFACE CIRCUIT AND ELECTRONIC PARTS TESTING SYSTEM
摘要
申请公布号	JPH04213739(A)	申请公布日期	1992.08.04
申请号	JP19900401160	申请日期	1990.12.10
申请人	FUJITSU LTD	发明人	MAESAKI YOSHIHIRO
分类号	G01R31/00;G01R31/26;G01R31/28;G06F13/00	主分类号	G01R31/00
代理机构		代理人
主权项
地址

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