发明名称 ARMATURE-COIL TESTING APPARATUS AND TESTING BRUSH HOLDER
摘要 PURPOSE:To obtain an armature-coil testing apparatus which can shorten the testing time and can prevent erroneous measurements and a simple testing brush holder which can reduce testing persons. CONSTITUTION:A pair of voltage brushes and a pair of current brushes 23 are fixed to a frame which is not shown with testing brush holders 10 which are juxtaposed in the depth direction in the Figure 1 (only one piece is shown in the Figure for the brushes 21 and 23). A current is made to flow into an armature 3 from a constant DC power supply 6 through the current brushes 23. The armature 3 is driven by the hands, and voltage across commutators 4 is sequentially obtained through the voltage brushes 21. The data are processed, and the results are shown on the CRT of a personal computer 33. The soundness of the armature coil is found based on the presence or absence of the displayed voltage abnormality (e.g. when the voltage is low, the armature coil is shorted). The measurement can be performed by sequentially pushing the testing brush holder 10 to the commutator piece with the hands.
申请公布号 JPH04213082(A) 申请公布日期 1992.08.04
申请号 JP19910040132 申请日期 1991.03.06
申请人 MITSUBISHI ELECTRIC CORP 发明人 NAKANISHI YUJI;HARUFUJI YOSHINOBU
分类号 G01R31/34;H02K11/00 主分类号 G01R31/34
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