发明名称 EXCESS VOLTAGE PROTECTION METHOD FOR SEMICONDUCTOR DEVICE
摘要 PURPOSE: To provide a method for protecting an overvoltage by internally limiting currents in a semiconductor device 10. CONSTITUTION: A semiconductor device 10 is provided with at least a first junction 40 having a prescribed impurity concentration at the both sides of the junction, and the pertinent first junction is provided so as to be separated from a second junction 42 or a current interrupting means. When a prescribed voltage is impressed to this device, a depletion area 44 from the above mentioned first junction is brought into contact with the depletion area 44 from the above-mentioned second junction or the current interrupting means, and currents are pinched off in a desired voltage. The above-mentioned pinch-off voltage can be changed according to the adjustment of a distance between the above-mentioned first junction and the above-mentioned second junction or a distance between the above-mentioned first junction and the above- mentioned current interrupting means, and the adjustment of the impurity concentration.
申请公布号 JPH04211131(A) 申请公布日期 1992.08.03
申请号 JP19900418205 申请日期 1990.12.26
申请人 MOTOROLA INC 发明人 MAIKERU PII MASUKERAIAA;DEIBITSUDO ENU OKADA
分类号 H01L29/73;H01L21/331;H01L29/10;H01L29/36;H01L29/66;H01L29/732;H01L29/735 主分类号 H01L29/73
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