发明名称 METHOD OF MANUFACTURING SILICON OXY NITRIDE THIN FILM
摘要 The method for producing silicon oxynitride film is characterized by installing a silicon nitride (Si3N4) target attached to the negative electrod and a glass substrate attached to the positive electrode in the vacuum container, pouring Ar and O2 gas into the container, and colliding a cation of the Ar gas to the target and then reacting a Si and N particle with a reactive O2 gas to form a Si-N-O particle film on the substrate. The produced film has a good adhesiveness, and is used as an insulating, dielectric and protecting film of semiconductor and photoelectron devices.
申请公布号 KR920006206(B1) 申请公布日期 1992.08.01
申请号 KR19880013830 申请日期 1988.10.22
申请人 SAMSUNG ELECTRON DEVICES CO., LTD. 发明人 IM, SONG - HWAN;LEE, JAE - WON
分类号 H01L49/00;(IPC1-7):H01L49/00 主分类号 H01L49/00
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