发明名称 |
METHOD OF MANUFACTURING SILICON OXY NITRIDE THIN FILM |
摘要 |
The method for producing silicon oxynitride film is characterized by installing a silicon nitride (Si3N4) target attached to the negative electrod and a glass substrate attached to the positive electrode in the vacuum container, pouring Ar and O2 gas into the container, and colliding a cation of the Ar gas to the target and then reacting a Si and N particle with a reactive O2 gas to form a Si-N-O particle film on the substrate. The produced film has a good adhesiveness, and is used as an insulating, dielectric and protecting film of semiconductor and photoelectron devices.
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申请公布号 |
KR920006206(B1) |
申请公布日期 |
1992.08.01 |
申请号 |
KR19880013830 |
申请日期 |
1988.10.22 |
申请人 |
SAMSUNG ELECTRON DEVICES CO., LTD. |
发明人 |
IM, SONG - HWAN;LEE, JAE - WON |
分类号 |
H01L49/00;(IPC1-7):H01L49/00 |
主分类号 |
H01L49/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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