| 摘要 |
PURPOSE:To highly accurately inspect a liquid crystal panel in a short time without requiring skillfulness by generating an upper and lower-limit reference patterns corresponding to the maximum and minimum luminance values in convolutions containing each picture element. CONSTITUTION:At the time of executing the inspection of a liquid crystal panel 11, a computer 33 selects a unit picture element containing no defect from the panel 11. Against each picture element of the selected unit picture element, an upper-limit reference pattern which gives the maximum luminance value in convolutions containing the picture of each picture element and to which a fixed luminance value is added and a lower-limit reference pattern which gives the minimum value in the same convolutions and from which a fixed luminance value is substrate are generated. Then the luminance value of each picture element of the upper- and lower-limit reference patterns is compared with the luminance value of the corresponding picture element in a pattern to be inspected and, when the luminance values of picture elements more than a fixed value of the pattern to be inspected fall between the upper- and lower- limit reference patterns, the panel 11 is discriminated as acceptable.
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