Method of accelerated testing of reliability of an IC comprising microprogram control system.

摘要

A method of acceleration testing of reliability of an LSI adopting a microprogram is realized simply. In a test mode, a microaddress is progressively incremented "1" by "1" and data processing within the LSI is executed in accordance with a microcode read out from a control memory based on the microaddress. As for a command decoder and an address generator, external data terminals are clamped to a voltage source or to a ground to permit a specific command to be fetched by the LSI under test. In this way, a majority of internal gates within the LSI are activated while the acceleration test is being conducted on the LSI. <IMAGE>