INSPECTION OF SEMICONDUCTOR LASER,申请号JP19900339351-传众专利搜索

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发明名称	INSPECTION OF SEMICONDUCTOR LASER
摘要
申请公布号	JPH04206944(A)	申请公布日期	1992.07.28
申请号	JP19900339351	申请日期	1990.11.30
申请人	MITSUBISHI ELECTRIC CORP	发明人	TADA KATSUHISA;YAMASHITA KOJI
分类号	H01L21/66;H01S5/00	主分类号	H01L21/66
代理机构		代理人
主权项
地址

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