| 摘要 |
The method uses the photoelectric sensitivity of the diode junctions. It consists, in order to test a defined diode belonging to a group of diodes connected in parallel, in illuminating the junction of the diode in question with light belonging to the range of photoelectric sensitivity of the said junction, in applying the group of diodes to the terminals of an electric load and in noting the appearance, at the terminals of the said load, of a photocurrent interpreted as correct operation of the diode in question. When the group of diodes forms part of an assembly within which it is connected in series with other groups of diodes, the diode under test is illuminated by an intermittent light while at least one diode of each of the other groups is continuously illuminated and a test is made to detect an intermittent photocurrent passing through a load at the terminals of which the assembly is connected. In the figure can be seen a test device which comprises a battery (1) of electroluminescent diodes and a photocurrent detector (2) driven by a computer (3). <IMAGE>
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