发明名称 |
FOCUSING EQUIPMENT |
摘要 |
PURPOSE:To obtain a focusing equipment capable of effective focusing operation in a short time independently of the change of reflectivity of a wafer, by installing a means for focusing detection which performs phase-locked loop detection of the value of a division means by setting the vibration frequency of a vibration mirror as a reference signal. CONSTITUTION:Light outputted from a light emitting element 4 is reflected by a wafer 1; the reflected light is divided into a reflected light and a transmitted light by a half mirror 9; the reflected light is detected by a photodetector 10 for monitoring; the transmitted light is reflected by a vibration mirror 11; the reflected light is made to pass a slit 13 and detected by a photodetector 14; the output of the photodetector 14 after amplification is set as a dividend input; the output of the photo detector 10 for monitoring after amplification is set as a divisor input; normalization is achieved by the division using a divider 17; the vibration frequency signal of the vibration mirror 11 is set as a reference signal; the normalized value is detected by a phase- locked loop detector 18 and then smoothed by a low pass filter 19; the transferring distance of the wafer 1 as far as a focusing point is obtained by a wafer stage control circuit 20; a wafer stage 2 is moved and subjected to focusing by a wafer stage vibrating circuit 21. Hence S-shape characteristics are not necessary to be again obtained in the case of different reflectivity of a wafer. |
申请公布号 |
JPH04196515(A) |
申请公布日期 |
1992.07.16 |
申请号 |
JP19900332417 |
申请日期 |
1990.11.28 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
IWAZAWA TOSHIYUKI;SATO TAKEO |
分类号 |
G03F7/207;G03F7/20;G03F9/00;H01L21/027;H01L21/30 |
主分类号 |
G03F7/207 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|