发明名称 INSPECTION SYSTEM FOR LOGICAL PACKAGE
摘要 PURPOSE:To improve the inspection efficiency by including a means which compares pattern data transferred to a host computer with result pattern data at the time of simulation through software and a means which displays information on the comparison result. CONSTITUTION:The value of a register memory being inspected is transferred from a test pattern output part 7 to an output pattern storage part 9 sequentially at intervals of one clock. When an inspection end signal 102 turns ON at the end of the inspection, an output pattern transfer signal 103 is turned ON and then an inspection output pattern is transferred from the output pattern storage part 9 to the host computer 4. The host computer 4 compares the inspection output pattern data which are transferred with the output pattern data of simulation by using the comparing means 12 and displays information on their coincidence or discrepancy on the display means 13. Consequently, the inspection time is shortened and a check omission in the inspection can be eliminated.
申请公布号 JPH04195345(A) 申请公布日期 1992.07.15
申请号 JP19900327754 申请日期 1990.11.27
申请人 KOUFU NIHON DENKI KK 发明人 WAKATSUKI KENICHI
分类号 G06F11/22;G06F11/25;G06F11/26;G06F17/50 主分类号 G06F11/22
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